Cover of: Atom-Probe Field Ion Microscopy | Tien T. Tsong

Atom-Probe Field Ion Microscopy

Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution
  • 397 Pages
  • 3.65 MB
  • 4605 Downloads
  • English
by
Cambridge University Press
Microscopy, Science/Mathematics, Science, Microscopes & Microscopy, Physics, Science / Physics, Science-Microscopes & Microscopy, Atom-probe field ion micro
The Physical Object
FormatPaperback
ID Numbers
Open LibraryOL7713665M
ISBN 100521019931
ISBN 139780521019934
OCLC/WorldCa60418176

The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.

Atom Probe Microscopy is aimed at researchers of all experience. Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion by: Schematic illustration of field ion microscopy (FIM), field desorption microscopy (FDM), and field emission microscopy (FEM).

(a) Field Ion image of Ni using Ne as an imaging gas and (b) field emission image taken from exactly the same Atom-Probe Field Ion Microscopy book.

(For color version of this figure, the reader is referred to the online version of this book.)Cited by: 2. The atom probe technique permits the imaging and chemical identification of individual and solid surfaces.

It is one of the most important experimental methods in the emerging field of atomic-scale science and technology. This book gives a definitive and up-to-date account of the field, and is written by leading authorities on the subject.

The Field ion microscope (FIM) was invented by Müller in It is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip.

On OctoErwin Müller and his Ph.D. student, Kanwar Bahadur (Pennsylvania State University) observed individual tungsten atoms on the surface of a sharply pointed tungsten tip by cooling. A definitive account of the theory, practice, and applications of atom probe field ion microscopy (APFIM).

The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. The very elegant development of the field ion microscope with the atom-probe has provided a powerful and useful technique for highly sensitive chemical analysis.

This book presents the basic principles of atom-probe field ion microscopy and illustrates the various capabilities of the technique in the study of solid surfaces and interfaces at. The specimen in atom probe tomography (APT) or field ion microscopy (FIM) is a field emitter, or more generally a field ion emission source.

This means that these two techniques exploit the colossal static electric field that is produced at the end. Buy Atom Probe Field Ion Microscopy Hardback by Cerezo A., Hetherington M. G., Miller M. K., Smith G. FRS ISBN: Pages: Book Description CAMBRIDGE UNIVERSITY PRESS, United Kingdom, Paperback.

Description Atom-Probe Field Ion Microscopy PDF

Condition: New. Language: English. Brand new Book. Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analysing surface atoms selected by the observer from the field ion Price Range: $ - $ The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique.

This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience Price: $ A historical background and general introduction to field emission and field-ionization, field-ion microscopy, and the atom probe is given.

Physical principles of field ion microscopy are. Atom Probe Field-Ion Microscopy: Imaging at the Atomic Level, M.K. Miller and M.G. Burke Compositional Mapping of the Microstructure of Materials, D.E.

Newbury et al. Processing Images and Selecting Regions of Interest, D.S. Bright et al. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy--including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.

Atom Probe Microscopy is aimed at researchers of all experience levels. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy--including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.

Atom Probe Microscopy is aimed at researchers of all experience levels.5/5(1). Find many great new & used options and get the best deals for Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution by Tien T.

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Tsong (, Paperback) at the best online prices at eBay. Free shipping for many products. Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion image.

Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique.

This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe Probe Microscopy is aimed at researchers of all experience 5/5(2).

Tsong, T.T.: Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution. Cambridge Author: Masahiko Tomitori. This book is one of the series of `Monographs on the physics and chemistry of materials', published by the Clarendon Press.

Its title is perhaps unduly restrictive inasmuch as the identification of single atoms in the field ion microscope (Atom probe FIM) is merely the end stage in a long chain of computer-assisted operations plus the equally important task of interpreting Author: T Mulvey.

Field ion microscopy (FIM) can be used to study the three-dimensional structure of materials, such as metals and semiconductors, because successive atom layers can be ionized and removed from the surface by field evaporation. @article{osti_, title = {Atom probe field ion microscopy of polysynthetically twinned titanium aluminide}, author = {Larson, D L and Miller, M K and Inui, H and Yamaguchi, M}, abstractNote = {Two phase {gamma}-based TiAl alloys are attractive for structural applications at high temperatures because they possess good elevated-temperature mechanical properties.

Atom probe field ion microscopy of high resistivity materials Conference Sibrandij, S J ; Larson, D J ; Miller, M K Over the last 30 years the atom probe has proved to be a powerful tool for studying nanometer-sized compositional fluctuations in a wide range of metallic alloys but has had only limited applications to semiconductors and ceramics.

This book presents the basic principles of atom-probe field ion microscopy and illustrates the various capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution. A useful comparison is given with two related techniques, electron microscopy and scanning tunnelling microscopy.

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The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience Brand: Springer New York.

The Atom Probe Field-Ion Microscope The atom probe combines an ultrahigh resolu-tion field-ion microscope (1lM) with a mass spec-trometer as shown in figure 1. The FIM is capable of producing images of the surface of a specimen in which each distinct point on the image is an indi-vidual atom.

Originally the motivation to develop the ToF atom probe was to use this method to obtain some more fundamental understanding of field ionization and field evaporation, the most basic physical processes in field-ion microscopy.

A serious limitation of the field ion microscope has been its inability to identify the chemical nature of the individually imaged atoms.

The newly conceived atom‐probe FIM is a combination probe‐hole FIM and mass spectrometer having single particle sensitivity. During observation, the observer selects an atomic site of interest by placing it over a probe hole in Cited by: 2. Physical principles of field ion microscopy 3.

FIM image interpretation and application 4. Physical principles of atom probe interpretation 5. Statistical analysis of atom probe data 6. Metallurgical applications 7. Atom probe studies of non Price: $ The Atom Probe Focused Interest Group (AP FIG) is a community of Microscopy Society of America (MSA) members with common interest in atom probe tomography (APT) and field ion microscopy (FIM) techniques for materials characterization.

We. The basic concepts of atom probe tomography and field ion microscopy, the implementations of a field ion microscope and a three-dimensional atom probe, including the state-of-the-art local.Atom Probe Tomography.

is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation .The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique.

This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels.